Global Semiconductor Inspection System Market – Industry Analysis and Forecast (2020-2027)

Global Semiconductor Inspection System Market size was US$ XX Bn in 2019 and is expected to reach US$ XX Bn by 2027, at a CAGR of XX% during forecast period.

Market Definition

Semiconductor inspection system is an equipment, which is used to detect the defects in the semiconductor device. It is used to ensure faultless quality of final product.

The report study has analyzed revenue impact of covid-19 pandemic on the sales revenue of market leaders, market followers and disrupters in the report and same is reflected in our analysis.

Market Dynamics

Growing demand of high performance and low cost semiconductors are the major key drivers behind the growth of market, Semiconductor inspection systems provide key benefits such as equipment problems detection, equipment durability and high performance and no delays during production are driving the growth of market. Furthermore, increasing need of semiconductor chip in various electronics devices such as mobile phone, computers, tablets, digital cameras, network switches and others are driving the growth of market. Growing adoption of IoT based devices and demand of semiconductor memory devices like DRAM, ROM and NVRAM are also boosting the growth of market.

However, growing mask inspection complexity is the major retraining factor that could hamper the growth of market. Limited number of manufacturers and shortage of resources are factors which could hinder the growth of market. The major challenge in the semiconductor inspection system is introduction of multi-layer wiring and planarization process in manufacturing of semiconductor devices.

Global Semiconductor Inspection System Market: Segmentation Analysis

By type, wafer semiconductor inspection system segment dominated the market in 2018 and is expected to maintain its dominance at CAGR of 14.7% during forecast period. Wafer is a thin slice of semiconductor, such as crystalline silicon, which is used for the fabrication of integrated circuits and to manufacture solar cells. Wafer semiconductor inspection system detects physical defects and pattern defects on wafers. Wafer inspection systems are active in maintaining high process throughput and detecting particles in the bottom of contact holes and on the surface which leads to the growth of market.

In July 2016, KLA-Tencor Corporation introduced six advanced wafer defect inspection and review systems for leading-edge IC device manufacturing.

By end user, large enterprises segment dominated the semiconductor inspection system market owing to the rapidly growing industrialization and demand for wide array of equipment to operate in large-scale assemblies. Alternatively, small and medium enterprises segment expected to witness the fastest growth at CAGR of XX% during forecast period. This is owing to the emergence of small and medium scale enterprises. In July 2019, KLA Corporation announced the 392x and 295x optical defect inspection systems and the eDR7380 e-beam defect review system. The new e-beam review system introduces innovations that cement its value as the essential link between defect and source. This portfolio is designed to accelerate time-to-market for leading-edge 3D NAND, DRAM and logic integrated circuits (ICs) throughout their product lifecycle.

Global Semiconductor Inspection System Market: Regional Analysis

Region wise, North America held the largest market share in 2018 and is expected to grow at CAGR of XX% during forecast period. The developed economies such as the US and Canada are dominate the market. This is owing to the presence of large companies, which are working towards manufacturing of semiconductor inspection system equipment.

The US based companies such as KLA-Tencor, Nanometrics, Rudolph Technologies and Applied Materials are some of the top four companies which dominate the market in terms of revenue share. KLA-Tencor, a pure-play inspection company, led most of the sectors and subsectors.

The objective of the report is to present a comprehensive analysis of the Global Semiconductor Inspection System Market including all the stakeholders of the industry. The past and current status of the industry with forecasted market size and trends are presented in the report with the analysis of complicated data in simple language. The report covers all the aspects of the industry with a dedicated study of key players that includes market leaders, followers and new entrants. PORTER, SVOR, PESTEL analysis with the potential impact of micro-economic factors of the market have been presented in the report. External as well as internal factors that are supposed to affect the business positively or negatively have been analyzed, which will give a clear futuristic view of the industry to the decision-makers. The report also helps in understanding Global Semiconductor Inspection System Market dynamics, structure by analyzing the market segments and projects the Global Semiconductor Inspection System Market. Clear representation of competitive analysis of key players by Application, price, financial position, Product portfolio, growth strategies, and regional presence in the Global Semiconductor Inspection System Market make the report investor’s guide.
The Scope of Global Semiconductor Inspection System Market

Global Semiconductor Inspection System Market, By Type

• Wafer semiconductor inspection system
• Mask semiconductor inspection system
Global Semiconductor Inspection System Market, By End User

• Small & medium enterprises
• Large enterprises
Global Semiconductor Inspection System Market, By Region

• North America
• Europe
• Asia Pacific
• South America
• Middle East and Africa
Global Semiconductor Inspection System Market, Key Players

• KLA-Tencor
• Applied Materials
• Herms Microvision
• Lasertech
• ASML Holding
• Lam Research
• JEOL
• FEI
• Carl Zeiss
• Nikon
• Hitachi High-Technologies
• Nanometrics Incorporated
• Planar Corporation
• Rudolph Technologies
• Toray Engineering
• Tokyo Seimitsu
• Cognex
• Nanotronics

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Contact info:Semiconductor Inspection System 

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